| 1 | Richard A. DeMillo and Aditya P. Mathur and W. Eric Wong
Some Critical Remarks on a Hierarchy of Fault-Detecting Abilities of Test Methods
IEEE Transactions of Software Engineering, 21(10), October 1995. |
|
| | Abstract: Available soon... |
| | @ARTICLE{DeMilloMW95,
author = {Richard A. DeMillo and Aditya P. Mathur and W. Eric Wong},
title = {Some Critical Remarks on a Hierarchy of Fault-Detecting Abilities of Test Methods},
journal = {IEEE Transactions of Software Engineering},
year = {1995},
month = {October},
volume = {21},
number = {10},
pages = {858-862}
} |
| 2 | Richard A. DeMillo and Li. TDsanchi and Aditya P. Mathur
A Two Dimensional Scheme To Evaluate The Adequacy Of Fault Tolerance Testing
Proceedings of the 3rd Workshop on Integrating Error Models with Fault Injection, 25-26 April 1994. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{DeMilloTM94,
author = {Richard A. DeMillo and Li. TDsanchi and Aditya P. Mathur},
title = {A Two Dimensional Scheme To Evaluate The Adequacy Of Fault Tolerance Testing},
booktitle = {Proceedings of the 3rd Workshop on Integrating Error Models with Fault Injection},
year = {1994},
address = {},
month = {25-26 April},
pages = {54-56}
} |
| 3 | Richard A. DeMillo and A. Jefferson Offutt
Experimental Results From an Automatic Test Case Generator
ACM Transactions on Software Engineering and Methodology, 2(2), April 1993. |
|
| | Abstract: Constraint-based testing is a novel way of generating test data to detect specific types of common programming faults. The conditions under which faults will be detected are encoded as mathematical systems of constraints in terms of program symbols. A set of tools, collectively called Godzilla, has been implemented that automatically generates constraint systems and solves them to create test cases for use by the Mothra testing system. Experimental results from using Godzilla show that the technique can produce test data that is very close in terms of mutation adequacy to test data that is produced manually, and at substantially reduced cost. Additionally, these experiments have suggested a new procedure for unit testing, where test cases are viewed as throw-away items rather than scarce resources. |
| | @ARTICLE{DeMilloO93,
author = {Richard A. DeMillo and A. Jefferson Offutt},
title = {Experimental Results From an Automatic Test Case Generator},
journal = {ACM Transactions on Software Engineering and Methodology},
year = {1993},
month = {April},
volume = {2},
number = {2},
pages = {109-127}
} |
| 4 | Richard A. DeMillo and A. Jefferson Offutt
Constraint-Based Automatic Test Data Generation
{IEEE} Trans. Software Eng., 17(9), 1991. |
|
| | Abstract: Available soon... |
| | @ARTICLE{DeMilloO91,
author = {Richard A. DeMillo and A. Jefferson Offutt},
title = {Constraint-Based Automatic Test Data Generation},
journal = {{IEEE} Trans. Software Eng.},
year = {1991},
month = {},
volume = {17},
number = {9},
pages = {900--910}
} |
| 5 | Richard A. DeMillo and E. W. Krauser and Aditya P. Mathur
Compiler-Integrated Program Mutation
Proceedings of the 5th Annual Computer Software and Applications Conference (COMPSAC'91)Tokyo, Japan, September 1991. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{DeMilloKM91,
author = {Richard A. DeMillo and E. W. Krauser and Aditya P. Mathur},
title = {Compiler-Integrated Program Mutation},
booktitle = {Proceedings of the 5th Annual Computer Software and Applications Conference (COMPSAC'91)},
year = {1991},
address = {Tokyo, Japan},
month = {September},
pages = {351-356}
} |
| 6 | Richard A. DeMillo and A. Jefferson Offutt
Constraint-Based Automatic Test Data Generation
IEEE Transactions on Software Engineering, 17(9), September 1991. |
|
| | Abstract: A novel technique for automatically generating test data is presented. The technique is based on mutation analysis and creates test data that approximate relative adequacy. It is a fault-based technique that uses algebraic constraints to describe test cases designed to find particular types of faults. A set of tools (collectively called Godzilla) that automatically generates constraints and solves them to create test cases for unit and module testing has been implemented. Godzilla has been integrated with the Mothratesting system and has been used as an effective way to generate test data that kill program mutants. The authors present an initial list of constraints and discuss some of the problems that have been solved to develop the complete implementation of the technique. |
| | @ARTICLE{DeMilloO91,
author = {Richard A. DeMillo and A. Jefferson Offutt},
title = {Constraint-Based Automatic Test Data Generation},
journal = {IEEE Transactions on Software Engineering},
year = {1991},
month = {September},
volume = {17},
number = {9},
pages = {900-910}
} |
| 7 | Richard A. DeMillo
Test Adequacy and Program Mutation
Proceedings of the 11th International Conference on Software Engineering (ICSE'89)Pittsburgh, Pennsylvania, 15-18 May 1989. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{DeMillo89,
author = {Richard A. DeMillo},
title = {Test Adequacy and Program Mutation},
booktitle = {Proceedings of the 11th International Conference on Software Engineering (ICSE'89)},
year = {1989},
address = {Pittsburgh, Pennsylvania},
month = {15-18 May},
pages = {355-356}
} |
| 8 | B. J. Choi, Richard A. DeMillo and E. W. Krauser and R. J. Martin and A. P. Mathur and A. Jefferson Offutt and H. Pan and E. H. Spafford
The Mothra Tool Set
Proceedings of the 22nd Annual Hawaii International Conference on System Sciences (HICSS'22), 3-6 January 1989. |
|
| | Abstract: Mothra is a software test environment that supports mutation-based testing of software systems. Mutation analysis is a powerful software testing technique that evaluates the adequacy of test data based on its ability to differentiate between the program under test and its mutants, where mutants are constructed by inserting single, simple errors into the program under test. This evaluation process also provides guidance in the creation of new test cases to provide more adequate testing. Mothra consists of a collection of individual tools, each of which implements a separate, independent function for the testing system. The initial Mothra tool set, for the most part, duplicates functionality existing in previous mutation analysis systems. Current efforts are concentrated on extending this basic tool set to include capabilities previously unavailable to the software testing community. The authors describe Mothra tool set and extensions planned for the future. |
| | @INPROCEEDINGS{ChoiDKMMOPS89,
author = {B. J. Choi, Richard A. DeMillo and E. W. Krauser and R. J. Martin and A. P. Mathur and A. Jefferson Offutt and H. Pan and E. H. Spafford},
title = {The Mothra Tool Set},
booktitle = {Proceedings of the 22nd Annual Hawaii International Conference on System Sciences (HICSS'22)},
year = {1989},
address = {},
month = {3-6 January},
pages = {275-284}
} |
| 9 | Richard A. DeMillo
Test Adequacy and Program Mutation
Proceedings of the 11th International Conference on Software Engineering, Pittsburg, PA, USA, May 15-18, 1989., 1989. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{DeMillo01,
author = {Richard A. DeMillo},
title = {Test Adequacy and Program Mutation},
booktitle = {Proceedings of the 11th International Conference on Software Engineering, Pittsburg, PA, USA, May 15-18, 1989.},
year = {1989},
address = {},
month = {},
pages = {355--356}
} |
| 10 | Hiralal Agrawal and Richard A. DeMillo and Bob Hathaway and William Hsu and Wynne Hsu and E. W. Krauser and R. J. Martin and Aditya P. Mathur and Eugene Spafford
Design of Mutant Operators for the C Programming Language
Purdue UniversitySERC-TR-41-P, West Lafayette, Indiana, 1989. |
|
| | Abstract: Mutation analysis is a method for reliable testing of large software systems. It provides a method for assessing the adequacy of test data. Mothra [DeMi87] is a mutation analysis based software testing environment that currently supports the testing of Fortran 77 programs. Work is underway to enhance thsi tool along several dimension. One of these is the addition of multilingual capability. C is one of the languages that we plan to support. This report describes the mutant operators designed for the proposed ANSI C programming language. Mutant operators are categorized using syntactic criteria. Such a classification is expected to be useful for an implementor of mutation based testing system. Another classification, useful for the tester, is based on the nature of tests that can be conducted using mutation analysis. This classification exposes the gen erality and completeness of mutation based testing. Each mutant operator s introduced with illustrative examples. The rationale supporting each operator is also provided. An appendix provides a cross-reference of all mutant operators for ease of referencing. The design described here is a result of long deliberations amongst authors of this report in, which several aspects of the C language and program development in C were examined. We intend this report to srve as a manual for thew C mutant operators fir researchers in software testing. |
| | @TECHREPORT{AgrawalDHHHKMMS89,
author = {Hiralal Agrawal and Richard A. DeMillo and Bob Hathaway and William Hsu and Wynne Hsu and E. W. Krauser and R. J. Martin and Aditya P. Mathur and Eugene Spafford},
title = {Design of Mutant Operators for the C Programming Language},
institution = {Purdue University},
year = {1989},
type = {techreport},
number = {SERC-TR-41-P},
address = {West Lafayette, Indiana},
month = {March},
} |
| 11 | Richard A. DeMillo and D. S. Guindi and K. N. King and W. M. McCracken and A. Jefferson Offutt
An Extended Overview of the Mothra Software Testing Environment
Proceedings of the 2nd Workshop on Software Testing, Verification, and Analysis (TVA'88)Banff Alberta,Canada, July 1988. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{DeMilloGMOK88,
author = {Richard A. DeMillo and D. S. Guindi and K. N. King and W. M. McCracken and A. Jefferson Offutt},
title = {An Extended Overview of the Mothra Software Testing Environment},
booktitle = {Proceedings of the 2nd Workshop on Software Testing, Verification, and Analysis (TVA'88)},
year = {1988},
address = {Banff Alberta,Canada},
month = {July},
pages = {142-151}
} |
| 12 | Richard A. DeMillo and D. S. Guindi and K. N. King and W. M. McCracken
An Overview of the Mothra Software Testing Environment
Purdue UniversitySERC-TR-3-P, West Lafayette, Indiana, 1987. |
|
| | Abstract: Available soon... |
| | @TECHREPORT{DeMilloGKM87,
author = {Richard A. DeMillo and D. S. Guindi and K. N. King and W. M. McCracken},
title = {An Overview of the Mothra Software Testing Environment},
institution = {Purdue University},
year = {1987},
type = {techreport},
number = {SERC-TR-3-P},
address = {West Lafayette, Indiana},
month = {},
} |
| 13 | Timothy Alan Budd and Richard A. DeMillo and Richard J. Lipton and Frederick Gerald Sayward
Theoretical and Empirical Studies on Using Program Mutation to Test the Functional Correctness of Programs
Proceedings of the 7th ACM SIGPLAN-SIGACT Symposium on Principles of Programming Languages (POPL'80)Las Vegas, Nevada, 28-30 January 1980. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{BuddDLS80,
author = {Timothy Alan Budd and Richard A. DeMillo and Richard J. Lipton and Frederick Gerald Sayward},
title = {Theoretical and Empirical Studies on Using Program Mutation to Test the Functional Correctness of Programs},
booktitle = {Proceedings of the 7th ACM SIGPLAN-SIGACT Symposium on Principles of Programming Languages (POPL'80)},
year = {1980},
address = {Las Vegas, Nevada},
month = {28-30 January},
pages = {220-233}
} |
| 14 | Allen Troy Acree and Timothy Alan Budd and Richard A. DeMillo and Richard J. Lipton and Frederick Gerald Sayward
Mutation Analysis
Georgia Institute of TechnologyGIT-ICS-79/08, Atlanta, Georgia, 1979. |
|
| | Abstract: Available soon... |
| | @TECHREPORT{AcreeBDLS79,
author = {Allen Troy Acree and Timothy Alan Budd and Richard A. DeMillo and Richard J. Lipton and Frederick Gerald Sayward},
title = {Mutation Analysis},
institution = {Georgia Institute of Technology},
year = {1979},
type = {techreport},
number = {GIT-ICS-79/08},
address = {Atlanta, Georgia},
month = {},
} |
| 15 | Richard A. DeMillo and Richard J. Lipton and Frederick Gerald Sayward
Program Mutation: A New Approach to Program Testing
Infotech State of the Art Report, Software Testing, 1979. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{DemiloLS79,
author = {Richard A. DeMillo and Richard J. Lipton and Frederick Gerald Sayward},
title = {Program Mutation: A New Approach to Program Testing},
booktitle = {Infotech State of the Art Report, Software Testing},
year = {1979},
address = {},
month = {},
pages = {107-126}
} |
| 16 | Richard A. DeMillo and Richard J. Lipton and Frederick Gerald Sayward
{P}rogram {M}utation: {A} {N}ew {A}pproach to {P}rogram {T}esting
Infotech State of the Art Report, Software Testing, 1979. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{DemiloLS79,
author = {Richard A. DeMillo and Richard J. Lipton and Frederick Gerald Sayward},
title = {{P}rogram {M}utation: {A} {N}ew {A}pproach to {P}rogram {T}esting},
booktitle = {Infotech State of the Art Report, Software Testing},
year = {1979},
address = {},
month = {},
pages = {107-126}
} |
| 17 | Timothy Alan Budd and Richard A. DeMillo and Richard J. Lipton and Frederick Gerald Sayward
The Design of a Prototype Mutation System for Program Testing
Proceedings of the AFIPS National Computer ConferenceAnaheim, New Jersey, 5-8 June 1978. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{BuddDLS78,
author = {Timothy Alan Budd and Richard A. DeMillo and Richard J. Lipton and Frederick Gerald Sayward},
title = {The Design of a Prototype Mutation System for Program Testing},
booktitle = {Proceedings of the AFIPS National Computer Conference},
year = {1978},
address = {Anaheim, New Jersey},
month = {5-8 June},
pages = {623-627}
} |
| 18 | Richard A. DeMillo and Richard J. Lipton and Frederick Gerald Sayward
Hints on Test Data Selection: Help for the Practicing Programmer
Computer, 11(4), April 1978. |
|
| | Abstract: In many cases tests of a program that uncover simple errors are also effective in uncovering much more complex errors. This so-called coupling effect can be used to save work during the testing process. |
| | @ARTICLE{DeMilloLS78,
author = {Richard A. DeMillo and Richard J. Lipton and Frederick Gerald Sayward},
title = {Hints on Test Data Selection: Help for the Practicing Programmer},
journal = {Computer},
year = {1978},
month = {April},
volume = {11},
number = {4},
pages = {34-41}
} |
| 19 | Richard A. DeMillo and Richard J. Lipton and Frederick G. Sayward
Hints on Test Data Selection: Help for the Practicing Programmer
{IEEE} Computer, 11(4), 1978. |
|
| | Abstract: Available soon... |
| | @ARTICLE{DeMilloLS78,
author = {Richard A. DeMillo and Richard J. Lipton and Frederick G. Sayward},
title = {Hints on Test Data Selection: Help for the Practicing Programmer},
journal = {{IEEE} Computer},
year = {1978},
month = {},
volume = {11},
number = {4},
pages = {34--41}
} |
